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An improved method of diagnosis of failed elements in arrays based on far-field radiation pattern

机译:基于远场辐射模式的阵列失效元素的诊断方法

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An improved approach of locating failed elements in antenna arrays based on far field radiation pattern is proposed using genetic algorithms (GA). The locations of the failed elements were found based on the comparison between the results of the proposed model and the simulation from HFSS which was treated as the measured results of the array with failed elements. The success rate of the diagnosis was improved by taking account the effect of the mutual coupling into the far field calculation. Furthermore, the positions of the failed elements were distinguished from their symmetrical positions which the method proposed by Ares could not accurately dealt with. A 16-elements linear array and 32 elements microstrip printed dipole array were studied with the application of the improved diagnosis method. This showed the validity of the suggested method.
机译:使用遗传算法(GA)提出了基于远场辐射模式的天线阵列中定位失败元素的改进方法。基于所提出的模型的结果与HFS的模拟之间的比较来找到失败元素的位置,其被视为具有失败元素的阵列的测量结果。通过考虑相互耦合到远场计算的影响,改善了诊断的成功率。此外,失败的元件的位置与其对称位置的区别,该位置不能准确地处理ARES提出的方法。采用改进的诊断方法研究了16元线性阵列和32个元素微带印刷的偶极子阵列。这表明了建议方法的有效性。

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