Method to Determine the Far-Field Beam Pattern of A Long Array From Subarray Beam Pattern Measurements

摘要

Beam pattern measurement is essential to verifying the performance of an array sonar. However, common problems in beam pattern measurement of arrays include constraints on achieving the far-field condition and reaching plane waves mainly due to limited measurement space as in acoustic water tank. For this purpose, the conventional method of measuring beam patterns in limited spaces, which transform near-field measurement data into far-field results, is used. However, the conventional method is time-consuming because of the dense spatial sampling. Hence, we devised a method to measure the beam pattern of a discrete line array in limited space based on the subarray method. In this method, a discrete line array with a measurement space that does not satisfy the far-field condition is divided into several subarrays, and the beam pattern of the line array can then be determined from the subarray measurements by the spatial convolution that is equivalent to the multiplication of beam pattern. The proposed method was verified through simulation and experimental measurement on a line array with 256 elements of 16 subarrays.