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Methods for refractive-index homogeneity calculation using Fourier-transform phase-shifting interferometry

机译:使用傅里叶变换相移干扰测量法计算折射率均匀性计算的方法

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Fourier-transform phase-shifting interferometry brings the possibility of a very precise measurement of refractive-index variation in a material. In a four-surface cavity, six first order interferograms are observed. In the standard way, an interference between waves reflected from a front and a rear surface of a sample is used to obtain refractive-index homogeneity. But another three interferograms contain information about inner inhomogeneity and can be used for its calculation as well. In this paper, all four calculation methods are presented and compared. The measurements and simulations show the methods give us globally similar outputs. However, due to calculation from different interferograms, every result is affected by different undesirable effects. This difference can be used for suppression of the effects and thus to refine the results.
机译:傅立叶变换相移干涉测量法引起了材料中非常精确地测量材料中的折射率变化的可能性。在四表面腔中,观察到六个第一订单干涉图。在标准方式中,使用从样品的前表面和后表面反射的波之间的干扰来获得折射率均匀性。但另外三个干涉图包含有关内部不均匀性的信息,也可以用于其计算。在本文中,提出和比较了所有四种计算方法。测量和仿真显示该方法给我们全局类似的输出。然而,由于从不同的干涉图的计算,每个结果都受到不同不良影响的影响。这种差异可用于抑制效果,从而优化结果。

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