首页> 外文会议>International Conference on Gettering and Defect Engineering in Semiconductor Technology >Statistical consideration of grain growth mechanism of multicrystalline Si by one directional solidification technique
【24h】

Statistical consideration of grain growth mechanism of multicrystalline Si by one directional solidification technique

机译:一种定向凝固技术多晶硅晶粒生长机理的统计考虑

获取原文

摘要

The grain evolution of multicrystalline Si was studied using the ingot grown from microcrystalline template. The grain shape evolution and width increase are not monotonic but may have 3 stages. On the other hand, the grain boundary (GB) analysis suggests that there exit 2 reactions, namely random GB annihilation at the initial stage and Σ3 generation and annihilation at the steady state.
机译:使用从微晶模板生长的铸锭研究了多晶硅晶粒的谷物演化。晶粒形状的进化和宽度增加不是单调,但可能有3个阶段。另一方面,晶界(GB)分析表明,在初始阶段和σ3处产生2反应,即随机GB湮灭,垂直状态下湮灭。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号