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Hydrogen Atom Desorption Induced By Electron Bombardment on Si Surface

机译:电子轰击对Si表面引起的氢原子解吸

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In this research, we aim at developing STM lithography with atomic resolution toward its application to quantum devices. First, we have confirmed successfully an atomically flat and hydrogen-terminated surface of Si (111) required for the lithography after unisotropic chemical etching in aqueous NH_4F solution with decreased dissolved oxygen. Next, we have studied hydrogen desorption from the surface by electron bombardment from an STM tip. It has been confirmed that desorption area increases approximately in proportion to the tunneling current.
机译:在这项研究中,我们的目的在于将STM光刻与原子分辨率朝向量子器件的应用开发。首先,我们已经证实了在NH_4F水溶液中在NH_4F水溶液中的溶解后的光刻所需的原子平坦和氢封端表面,其具有降低的溶解氧。接下来,我们通过电子轰击从STM尖端从表面进行了氢解吸。已经证实解吸区域与隧道电流大致成比例地增加。

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