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The Direct Observation of Grain Refinement Mechanism in Advanced Multicomponent γ-TiAl Based Structural Intermetallics Doped with Boron

机译:用硼掺杂硼的高级多组分γγ电粒子结构金属间质谱的直接观察

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The synthesis of Ti-44Al-5Nb-2Cr-1.5Zr-0.4B-0.07La and Ti-44Al-5Nb-1Cr-1.5Zr-1B-0.17La (at.%) intermetallic alloys was performed from pure metals by the electron beam semi-continuous casting technique. Alloys are characterized by convoluted microstructure whose refinement is progressive with the boron content increase. The specimens were analyzed using JEOL JSM6610 scanning electron microscope (SEM) equipped with electron backscatter diffraction and energy dispersive X-ray spectroscopy (EDX) systems. The boron alloying causes precipitation of micro-dimensional complex (Ti,Nb)B borides within solidifying melt. These particles-inoculants promote the formation of finer micro-structure. Auger spectrometry was applied for quantitative elemental analysis of borides, using PHI-680 device. It was proven that the origin of structure refinement consists in solid-phase seeding and germination of α_2-Ti_3Al-phase on (Ti,Nb)B ribbon-like colonies with subsequent growth of α_2-laths through the volumetrically prevailing γ-TiAl domains. We fixed several consecutive stages of microstructure refinement process. The description of these stages is supported with the dimensional, crystallographic and compositional characterization of microstructural constituents. The work provides a basis for new techniques of microstructure/ mechanical properties engineering of studied materials.
机译:通过电子从纯金属进行Ti-44Al-5NB-2Cr-1.5Zr-0.4b-0.07La和Ti-44Al-5nb-1cr-1.5zr-1b-0.17la(atty)金属间合金的合成光束半连铸技术。合金的特征在于络合的微观结构,其细纹随着硼含量的增加而进行。使用JEOL JSM6610扫描电子显微镜(SEM)分析了标本,配备有电子反向散射衍射和能量分散X射线光谱(EDX)系统。硼合金化导致微尺寸复合物(Ti,Nb)B硼化物的沉淀在固化熔体内。这些颗粒 - 接种物促进了更细微的微结构的形成。使用PHI-680器件施加螺旋钻光谱法用于硼化物的定量元素分析。据证明,结构细化的起源在于(Ti,Nb)B形菌状菌落的固相接种和萌发,随后通过体积普遍的γ-Tial结构域生长α_2-LARHs。我们修复了几个连续的微观结构细化过程阶段。对这些阶段的描述得到了微观结构成分的尺寸,结晶和组成特征。该工作为研究的材料的微观结构/机械性能工程的新技术提供了基础。

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