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Origin of Photoluminescence from Silicon nanowires Prepared by Metal Induced Etching (MIE)

机译:金属诱导蚀刻制备的硅纳米线的光致发光起源(mie)

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In this present study the origin of luminescence from silicon nanowires (SiNws) has been studied. SiNWs are fabricated on Si substrate by metal induced chemical etching (MIE). Here it is found that the band gap of SiNWs is higher than the gap of luminescent states in SiNWs which leads to the effect of Si=O bond. The band gap is estimated from diffuse reflectance analysis. Here we observe that band gap can be tailored depending on size (quantum confinement) but photoluminescence (PL) from all the sample is found to be fixed at 1.91 eV. This study is important for the understanding of origin of photoluminescence.
机译:在本发明的研究中,研究了来自硅纳米线(SINW)的发光起源。通过金属诱导的化学蚀刻(MIE)在Si衬底上制造SINWS。这里发现SINW的带隙高于SINW中发光状态的间隙,这导致Si = O键的效果。带隙估计来自漫反射率分析。在这里,我们观察到,根据尺寸(量子限制)可以根据尺寸(量子限制)而是从所有样品中发现的光致发光(PL)定制,以固定在1.91eV中。本研究对于对光致发光起源的理解是重要的。

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