The Application Research of ID Chip for Strain Measurement in Full Scale Aircraft Structure Strength Static Test

摘要

There are three main practical challenges must be faced when ID chip was introduced to increase the operating efficiency in a full scale static structure test. The first problem is how to protect ID Chip which is easily damaged at the complex test site; the second problem is what connection type should be adopted when ID Chip is connected with the wires; the last and most important issue is how to establish and record the one-one correspondences rapidly between strain gauge numbers and ID chip identification information. Against these existing the problems, some technical improvement solutions were proposed to refine the ID Chip applying conditions. And these solutions were employed and tested in a large scale aircraft static structure test. The test results show that the efficiency of test preparation cycle is increased by 40%, and the period and times of the test is greatly reduced. In a sense, the successful solution of these three practical issues makes the application value of ID Chip to be truly achieved and accelerate the automatic process of strain measurement.