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Compensating for Creep Effects in One-indent Nanoindentation Tests

机译:补偿一次缩进纳米狭窄测试中的蠕变效应

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Detailed observations of nanoindentation static creep effects exhibited in polymethylmethacrylate (PMMA) is presented and discussed in this study. One-indent nanoindentation technique, the partial unloading measurement (PUM) method, is compared with the basic measurement BM method (i.e., an array of multiple single indents with various magnitudes). The experimental results for PMMA reveal a strong dependence on the loading conditions. It was found that the PUM results for PMMA are not consistent with the corresponding BM results due to significant static. The creep depths accumulated and increased the indentation depth, and thus the contact area. The hardness and elastic modulus evaluated from these experimental results decreased with the indentation depth (or load).
机译:在本研究中介绍并讨论在聚甲基丙烯酸甲酯(PMMA)中展示和讨论的纳米凸缘静态蠕变效应的详细观察。 一种缩进的纳米狭窄技术,部分卸载测量(PUM)方法与基本测量BM方法进行比较(即,具有各种幅度的多个单个缩进阵列)。 PMMA的实验结果揭示了对装载条件的强烈依赖。 结果发现,由于显着的静态,PMMA的PMMA结果与相应的BM结果不一致。 蠕变深度累积并增加了压痕深度,从而增加了接触面积。 从这些实验结果评价的硬度和弹性模量随压痕深度(或负载)而降低。

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