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Study of gold wire bonding on 0.1 amp;#x03BC;m soft gold film substrate

机译:0.1&#X03BC的金线键合的研究; M软金膜基材

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0.1 μm soft gold film substrate was ultrasonic bonded with 0.6 mil gold wire, which effectively reduced gold assumption comparing to the traditional 0.3∼0.5 μm soft gold film substrate. The substrate showed good bondability by wire pull test (WPT) and perfect reliability by high temperature storage test (HTST). The bonding structure in failure mode of wire pull test was studied by focused ion beam (FIB) and scanning electron microscope (SEM) observation. A design of experiments (DOE) was set up to figure out the optimistic process window for gold wire bonding on Ni-Pd-Au substrate.
机译:0.1μm柔软金膜基板与0.6密耳金线进行超声波键合,有效地降低了与传统的0.3〜0.5μm柔软金膜基板相比的金假设。基材通过电线拉动试验(WPT)和通过高温储存测试(HTST)的完美可靠性显示出良好的粘合性。通过聚焦离子束(FIB)和扫描电子显微镜(SEM)观察研究了线拉试验失效模式的粘合结构。设立了实验(DOE)的设计,以确定Ni-Pd-Au衬底上的金线键合的乐观过程窗口。

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