Surface and Interface Characterization of Polymer Films

摘要

The surfaces and interfaces of polymer films impact many performance properties including adhesion, printability, barrier performance and physical appearance. This talk will provide an overview of x-ray photoelectron spectroscopy (XPS, also known as ESCA) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). These two tools are, arguably, the most powerful analytical techniques available for probing the chemical structure of polymer surfaces and interfaces. Case studies from converter films will be discussed to demonstrate these capabilities.