首页> 外文会议>IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry >A MOEMS ACCELEROMETER BASED ON DIFFRACTION GRATING WITH IMPROVED MECHANICAL STRUCTURE
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A MOEMS ACCELEROMETER BASED ON DIFFRACTION GRATING WITH IMPROVED MECHANICAL STRUCTURE

机译:基于衍射光栅的MOEMS加速度计改进机械结构

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In this paper, an improved MOEMS accelerometer is described, which is based on integrated grating with phase modulation. This device is composed of a laser diode, an optoelectronic processing circuit and a sensing chip consisted of a piezoelectric translator, an integrated grating as a reflective mirror on a transparent substrate and a mechanical part of a bulk silicon proof mass suspended by four cantilevers whose upper surface acted as another mirror. This device generates a series of interference fringes by two diffracted beams when illuminated with coherent light, whose intensities are modulated by the relative distance between the grating and the proof mass. The intensities of the interference fringes varied with the distance alteration caused by external accelerations, which is proportional to the acceleration. It is realizable to get the magnitude of acceleration by using a differential circuit to detect the distance. A modified structure is introduced in this paper to obtain high sensitivity and reduce cross-sensitivity between different sensitive axes. Compared to experimental results before the simulation and theory analysis demonstrate that this modified MOEMS accelerometer has a good performance with higher static acceleration sensitivity of 3×10~3V/g and very low crosstalk.
机译:在本文中,一种改进的MOEMS加速度计进行了说明,这是基于与相位调制集成光栅。该装置是由一个激光二极管的,光电子处理电路和感测芯片包括压电转换器的,集成的光栅作为在透明基板上的反射镜和由四个悬臂,其上悬挂下来的体硅质量块的机械部分表面充当另一个镜像。当用相干光,其强度由光栅和检测质量体之间的相对距离被调制照射本设备会产生由两个衍射光束的一系列干涉条纹。随距离变化而变化的干涉条纹的强度引起的外部加速度,这是与加速度成比例。这是可实现的,通过使用微分电路检测的距离以获得加速度的大小。一种改进的结构,在本文中以获得高灵敏度和降低不同的敏感轴之间的交叉灵敏度引入。相比于模拟和理论分析之前的实验结果表明,该改性MOEMS加速度计具有3×10〜3V / g,非常低串扰的高静态加速度灵敏度良好的性能。

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