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DEVELOPMENT OF FIRST PRODUCTION FLAW DETECTING SYSTEM FOR ON-DEMAND REPAIR OF LARGE-SCALE CIRCUIT

机译:基于大规模电路按需修复的第一生产漏洞检测系统的开发

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In order to realize efficient high-mix low-volume production, improvement of yield rate by reducing production flaw is important technique. Manufacturing of touch panel display with large scale wiring board is a typical example of the high-mix low-volume production. AIST has proposed Laser assisted Ink-Jet printing (LIJ) technology, which can repair the flaw of circuit with silver nanoparticle ink. To establish in-process repairing system for touch panel display, a first production flaw detecting system is demanded with combining to the LIJ technology. Therefore, the aim of this study is to develop a new first production flaw detecting system, which detects flaw of large-scale circuit quickly. In this report, we mention to a basic concept of proposed system, and performed some preliminary experiments using developed measurement systems. Demanded performance for first production flaw detecting system was discussed. And the concept of basic style of detecting system and optical set-up was selected. A preliminary first production flaw detecting system with galvano-scanner and multi photodiode array was developed to confirm a detection of flaws and pattern profile. Some basically experiments have been conducted to check the performance of this system. An imitated flaw was scratched on the circuit patterns and the experimental results show the sclatched flaw has been detected by this equipment. The height detecting technique for this system was mentioned and preliminary experiment using developed system. By using laser trigonometry method, displacement of height information was detected sufficiently.
机译:为了实现高效的高混合低批量生产,通过减少生产缺陷的产量率提高是重要的技术。带大型布线板的触摸面板显示器的制造是高混合低批量生产的典型示例。 AIST提出了激光辅助喷墨印刷(LIJ)技术,可以使用银纳米粒子油墨修复电路的漏洞。为了建立用于触摸面板显示器的过程修复系统,需要一个第一个生产漏洞检测系统,并结合LIJ技术。因此,本研究的目的是开发一种新的第一生产漏洞检测系统,可快速检测大型电路的漏洞。在本报告中,我们提到了所提出的系统的基本概念,并使用开发的测量系统进行了一些初步实验。讨论了对第一次生产漏洞检测系统的要求表现。选择了检测系统和光学设置的基本风格的概念。开发了具有Galvano-Scanner和多光电二极管阵列的初步生产探伤系统,以确认缺陷和图案轮廓的检测。已经进行了一些基本的实验以检查该系统的性能。在电路模式上划伤了模仿缺陷,实验结果显示了该设备检测到悬浮的缺陷。利用开发系统提及该系统的高度检测技术和初步实验。通过使用激光三角仪方法,可以获得高度信息的位移。

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