Positron annihilation lifetime spectroscopy measurement of Ge_5As_(37)S_(58) glass

机译：正电子湮没寿命光谱测量GE_5AS_（37）S_（58）玻璃

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Defect configuration of Ge_5As_(37)S_(58) chalcogenide glasses was studied by positron annihilation lifetime spectra (PALS). Size of nanovoids was determined using Liao's formula for radius of nanovoids in spherical approximation. Peculiarities of structural features were obtained from Raman spectra.

机译：通过正电子湮没寿命谱（PAL）研究了GE_5AS_（37）S_（58）硫族化物玻璃的缺陷配置。使用Liao的纳米型纳米型半径的纳米型纳米型在球面近似下测定纳米拓。从拉曼光谱获得结构特征的特征。

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《International Workshop on Functional Nanomaterials and Devices》|2014年||共5页
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A. Stronski;
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中图分类 TB383-53;
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Chalcogenide glasses; Positron annihilation lifetime spectroscopy; Nanovoids;

机译：硫属化物眼镜;正电子湮没寿命光谱;纳米拓;

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2. Measurements of defect structures by positron annihilation lifetime spectroscopy of the tellurite glass TeO2-P2O5-ZnO-LiNbO3 doped with ions of rare earth elements: Er-3+, Nd3+ and Gd3+ [J] . Golis E., Yousef El. S., Reben M., Solid state sciences . 2015,第期

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3. Prediction of free-volume-type correlations in glassy chalcogenides from positron annihilation lifetime measurements [J] . O. Shpotyuk, A. Ingram, M. Shpotyuk, Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms . 2014,第nova1期

机译：从正电子an没寿命测量预测玻璃态硫族化物中的自由体积类型相关性
4. Positron annihilation lifetime spectroscopy measurement of Ge_5As_(37)S_(58) glass [C] . A. Stronski International Workshop on Functional Nanomaterials and Devices . 2014

机译：正电子湮没寿命光谱测量GE_5AS_（37）S_（58）玻璃
5. Application of positron annihilation induced auger electron spectroscopy in measurements of interface defects and the stability of ultra-thin aluminum films grown on gallium arsenide(100) [D] . Chen, Wu-Chi 2000

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机译：复合冻干配方中动力学的特征：II。玻璃动力学和全球流动性，快速动力学和正电子湮没寿命（PALS）的密度变异分析。
8. Development of an Electron-Positron Source for Positron Annihilation Lifetime Spectroscopy [R] . Nees, J., Hou, B., Modovanakis, A., 2009

机译：正电子湮没寿命谱的电子 - 正电子源的研制

Positron annihilation lifetime spectroscopy measurement of Ge_5As_(37)S_(58) glass

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