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Effect of High Intensity Pulsed Ion Beam of Carbon on Subsurface Layers of Zirconia Ceramics

机译:高强度脉冲离子束对氧化锆陶瓷地下层的影响

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The effect of high intensity pulsed beam (HIPB) of accelerated carbon ions on zirconia ceramics of the 97ZrO_2-3Y_2O_3 (in mol%) composition is investigated. The parameters of the ion beam are as follows: the energy of the accelerated ions is 200 keV, pulse duration is 100 ns, pulse current density equal to 40 and 150 A/cm~2. It was revealed that ions treatment of ceramics leads to melting of the subsurface layer. In this area, the grains are elongated towards the surface. Upon treatment of ceramics by accelerated ions with the pulse energy density equal to 3 J/cm~2 (fluence ≥9.4·10~(15) cm~(–2)), formation of zirconia cubic phases up to 30 mass% is observed. The size of coherent-scattering region X-rays of the grains of the c-ZrO_2 phase is 15–20 nm. The analysis of the elemental composition of the irradiated surface layers by secondary ion mass spectrometry (SIMS) method makes possible to conclude that formation of high concentration of non-stoichiometric oxygen vacancies under ion treatment is the main cause of the cubic phase stabilization in zirconia.
机译:研究了高强度脉冲梁(HIPB)的加速碳离子对97 ZRO_2-3Y_2O_3(MOL%)组合物的氧化锆陶瓷的影响。离子束的参数如下:加速离子的能量为200keV,脉冲持续时间为100ns,脉冲电流密度等于40和150a / cm〜2。揭示了陶瓷的离子处理导致地下层的熔化。在该区域中,晶粒朝向表面伸长。通过加速离子处理陶瓷,脉冲能量密度等于3J / cm〜2(注量≥9.4·10〜(15)cm〜(-2)),观察到氧化锆立方相的形成高达30质量% 。 C-ZRO_2相的晶粒的相干散射区域X射线的尺寸为15-20nm。通过二次离子质谱法(SIMS)方法对辐照表面层的元素组成的分析可以得出结论,在离子处理下形成高浓度的非化学计量氧空位是氧化锆立方相稳定的主要原因。

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