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In-Situ Spectroscopic Ellipsometry and Electrochemical Studies of the Barrier Layer on Iron in Borate Buffer Solutions

机译:在硼酸硼缓冲溶液中铁对抗层的原位光谱椭圆形和电化学研究

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摘要

The growth and properties of the passive films on iron in EDTA (ethylene diamine tetra-acetic acid, disodium salt)-containing borate buffer solution of pH = 8.15 were investigated using in-situ Spectroscopic Ellipsometry (SE), Mott-Schottky analysis, and X-ray photoelectron spectroscopy (XPS). EDTA effectively suppressed the formation of the outer layer of the passive film, thereby rendering the barrier layer amenable to direct examination. It was shown that the barrier layer growth was completed in about 10 s upon stepping the potential in the anodic direction. Contrariwise, thinning of the barrier oxide layer upon stepping the potential in the cathodic direction occurred at a rate that was two orders in magnitude lower than the growth rate. The information obtained above was interpreted in terms of the Point Defect Model (PDM) containing both oxygen vacancies and cation interstitials, with the latter being the dominant defect in the barrier layer.
机译:使用原位光谱椭圆形(SE),MOTT-SCOTTKY分析,研究了EDTA(乙二胺四乙酸,二钠盐) - 硼酸盐缓冲溶液的硼酸酯缓冲溶液的硼酸盐缓冲溶液的生长和性质。 X射线光电子体光谱(XPS)。 EDTA有效地抑制了无源膜的外层的形成,从而使得使阻挡层允许直接检查。结果表明,在步进阳极方向上的电位,在约10秒内完成阻挡层生长。相比之下,在步进在阴极方向上的电位下发生阻挡氧化物层的速度以比生长速率低两个次数的速率发生。以上面获得的信息在包含氧气空位和阳离子间质间质的点缺陷模型(PDM)来解释,后者是阻挡层中的主要缺陷。

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