Computing areas of pinched hysteresis loops of mem-systems in OrCAD PSPICE

摘要

The pinched hysteresis loop belongs to the fingerprints of the so-called mem-systems, their well-known special cases being memristors. The memory effect of the system is determined by the area of the curve lobes which gradually decrease with increasing repeating frequency of the excitation signal. The paper describes a method for automated computation of the above areas via the commonly utilized OrCAD PSpice simulation software with the help of special measuring functions of the PROBE postprocessor. The usefulness of the method is illustrated on an example of the analysis of a TiO_2 memristor.