X-ray microscopy using two phase contrast imaging techniques: two dimensional grating interferometry and speckle tracking

摘要

Two phase contrast imaging techniques, namely two dimensional grating interferometry and X-ray speckle tracking (XST), have been combined with the use of a Fresnel Zone Plate (FZP) for application to X-ray microscopy. Both techniques allows the phase shift introduced by a sample on a hard X-ray beam in two dimensions, to be recovered with a high sensitivity and low requirements on transverse and longitudinal coherence. Sub-micron phase imaging of carbon fibres was achieved using the two methods thanks to the high magnification ratio of the FZP. Advantages, drawbacks and differences between these two techniques for X-ray microscopy are discussed.