PbS Nanodots Embedded in ZrO2 Thin Films for Ultraviolet Radiation Dosimetry

摘要

PbS nanodots embedded in ZrO2 thin film matrix (ZrO2:PbS films) were investigated for UV radiation dosimetry purposes. ZrO2:PbS films were UV irradiated using wavelengths 250 - 400 nm. Photoelectron emission spectra of ZrO2:PbS films were recorded and band structure of the films was calculated. It was found that density of localized states increased with increase in concentration of PbS nanodots which allowed to suggest that PbS nanodots are responsible for creation of localized states. Number of localized states decreased after UV irradiation. The linear correlation between number of localized states and time of UV exposure was observed. Observed changes in band structure of ZrO2:PbS films under the influence of UV irradiation suggest that the films may be considered as an effective material for UV radiation dosimetry, PbS nanodots being the UV sensitive substance of the films.