Improved Functional Capabilities of Quasi-two-dimensional Tungsten Oxide Nanostructures

摘要

Electrical properties and morphology of orthorhombic β-WO_3 nano-flakes with thickness of -7-9 nm were investigated at the nanoscale using energy dispersive X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA?). CSFS-AFM analysis established good correlation between the topography of the developed nanostructures and various features of WO_3 nano-flakes synthesized via a two-step sol-gel-exfoliation method. It was determined that P-WO_3 nano-flakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, micro- and nano-structured WO_3 synthesized at alternative temperatures.