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Carrier escape from ground state and non-zero resonance frequency at low bias powers for semiconductor quantum-dot lasers

机译:载波从用于半导体量子点激光器的低偏置功率的地面状态和非零共振频率逃逸

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The three-dimensional confinement of electrons and holes in the semiconductor quantum dot (QD) structure profoundlychanges its density of states compared to the bulk semiconductor or the thin-film quantum well (QW) structure. The aimof this paper is to th
机译:与散装半导体或薄膜量子阱(QW)结构相比,半导体量子点(QD)结构中的电子和孔中的三维限制在其各状态的密度上。本文的目标是

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