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Analysis of electromagnetic wave radiation from C-slot RFID tag mounted on impedance curved surface using the UTD solution

机译:利用UTD溶液分析阻抗弯曲表面上的C槽RFID标签的电磁波辐射

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The electromagnetic (EM) wave radiation of the C-slot radio frequency identification (RFID) tag located on the impedance surface in this paper is analyzed using the uniform geometrical theory of diffraction (UTD) solution. The UTD radiation solution for the impedance curved surface is employed to predict the EM wave radiation of the RFID tag mounted on the impedance curved product surface. The UTD radiation solution provides the physical insight of the EM field at the observation point and requires less computational time than the other numerical methods. The results show that the UTD radiation solution can accurately predict the radiation pattern of the proposed C-slot RFID tag mounted on the product. The proposed tag antenna can efficiently be applied to the curved surface object, such as the curved metallic product coated with dielectric (layers of paints).
机译:使用均匀的衍射(UTD)溶液,分析了位于该纸张上的阻抗表面上的C-Slot射频识别(RFID)标签的电磁(EM)波辐射。用于阻抗弯曲表面的UTD辐射解决方案用于预测安装在阻抗弯曲产品表面上的RFID标签的EM波辐射。 UTD辐射解决方案提供了在观察点处的EM场的物理识别,并且需要比其他数值方法更少的计算时间。结果表明,UTD辐射解决方案可以精确地预测安装在产品上的所提出的C槽RFID标签的辐射图案。所提出的标签天线可以有效地施加到弯曲的表面物体上,例如涂覆有电介质(涂料层)的弯曲金属产物。

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