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Thermal Stability and Tribological Properties of Fluorinated Amorphous Carbon Thin Films Doped with Nitrogen

机译:掺杂氮的氟化非晶碳薄膜的热稳定性和摩擦学性质

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Nitrogen doped fluorinated amorphous carbon thin films(a-C:N:F)were prepared by radio frequency plasma enhanced chemical vapor deposition(rf-PECVD)under different deposited condition using CH4,CF4,and N2 as source gases.The thin films were annealed at different temperature.The influence of doped nitrogen on the chemical structure,tribological and thermal properties of thin films were investigated by Atomic force microscopy(AFM),Fourier transform infrared absorption spectrometry(FTIR),X-ray photoelectron spectrum spectra(XPS),and thermogravimetry(TG).The results indicated that the thin films presence a compact and smooth morphology surface after the nitrogen doped.After incorporation of nitrogen,the H atoms are replaced partially by the N atoms in the thin films.The degree of cross-linking of the carbon network in the thin films is enhanced.The chemical bonds of C=N,C≡N,and C—Nx(x=1,2,3)have formed in the films.The relative content of sp2 graphite phase increases.The thermal stability temperature of the films deposited at r=0.5(r=N2/[CF4+CH4+N2])is 420 °C.The tribological properties improve greatly,and the friction coefficient of the a-C:N:F thin films ranges approximately from 0.20 to 0.36.
机译:氮掺杂的氟化无定形碳薄膜(AC:N:F)通过射频等离子体增强化学气相沉积(RF-PECVD)不同的沉积条件下的使用CH4,CF4和N2的源gases.The薄膜在退火制备掺杂氮的化学结构不同temperature.The影响,薄膜的摩擦和热性能是通过原子力显微镜(AFM)研究,傅里叶变换红外吸收光谱法(FTIR),X射线光电子光谱光谱(XPS),以及热重(TG)。结果表明,该薄膜存在一个紧凑和光滑表面形态的氮的氮doped.After掺入后,将H原子部分由交联的细度films.The N原子取代在薄膜中的碳网的是在SP2石墨相的增加films.The相对含量都形成C = N,C≡N,和C-NX(X = 1,2,3)的enhanced.The化学键.The热稳定性吨沉积在r = 0.5(R = N2 / [CF4 + CH4 + N2])的薄膜的emperature是420°C.The摩擦学性能大大提高,并且AC的摩擦系数:N:F薄膜从大约0.20的范围0.36。

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