Pitfalls by applying pulsed EMC ESD System Level Stress Requirements to On-Chip Protection Design by Automotive Examples

摘要

A "SMART" system takes more than just plugging together single smart components, especially in case of ESD and EMC robust systems. In the automotive industry, this component vs. system approach is very present. The trend is going towards handing-over system-requirements down to components for several reasons. But by violating the border from a functional system to unpowered components, you can get easily being trapped by some surprising pitfalls. Based on automotive examples we provide an overview about the nature of pulsed stress conditions, simulation, modelling and advanced analysis methods. We would like to raise the awareness, that size does not always matter, and "ESD" only is not necessarily the root cause of ESD (device) failures.