High temperature X-ray diffraction studies of the sample heating units

摘要

By means of the in situ high temperature X-ray diffraction (HT-XRD), sample heating units (Pt) is studied as the standard sample for temperature correction in the temperature range 28-1050°C according to method provided by Rigaku and method of copper target K_α radiation( K_(α1), K_(α2) ). By linear fitting, polynomial fitting and custom function fitting, the lattice parameters at each temperature point are also calculated and compared. Besides, different views are put forward for three aspects about the temperature correction in Rigaku diffractometer manual, and the complex phenomenon of the experiment are preliminarily discussed using the theoretical calculation and experimental diffraction data. Theory and experiment show that Custom fitting has higher accuracy, Selection of the degree of the Fitting polynomial must be greater than or equal to 3, the lattice constant of Platinum nonlinear increases with temperature. In the process of heating, Pt and environmental elements may be coupled reaction, platinum is oxidized to form a new oxide Pt3O2.