Reliability Testing on a Multilayer Chip Inductor Fabricated From a Ferrite With a 350°C Curie Point

摘要

As more electronics are used in down-hole energy exploration, under the hood automotive applications, and in other environments where temperatures exceed 200°C; there is a need for compact passive magnetic components that operate reliably at elevated temperatures. Most ferrites used to make multi layer ceramic inductors have Curie temperatures in the 100-200°C range. As temperatures rise above the Curie point ferrites lose their magnetic properties and become paramagnetic. This means that traditional multi-layer ceramic inductors suffer severe performance degradation when operated at elevated temperatures. Therefore, ferrite materials with higher Curie temperatures need to be developed to increase device performance and reliability at these high temperatures. In this work inductors were made from a low-temperature, co-fire compatible, ferrite with a Curie temperature of 350°C. The inductors were first subjected to a 1000 hour life test at 300°C during which the electrical parameters were found to change no more than 4%. The inductance, resistance, core loss, and saturation flux density of the inductors were measured at various temperatures. Additional testing focused on the effect of temperature on the device's frequency profile and performance changes under thermal cycling and thermal shock.