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Low Coherence Interferometry for the Inline Measurement of Translucent Multilayer Structures

机译:半透明多层结构的内联测量的低相干干涉测量

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In a joint national project with industrial partners in the sectors of sensor technology, mechanical engineering and plastic film production, the Fraunhofer Institute for Laser Technology (ILT) has developed a novel optical sensor to monitor the production of plastic films based on interferometric measurements with low coherent radiation [1]. This technique of Optical Coherence Tomography (OCT) is an imaging method generating high-resolution tomography scans. The sensor measures the thicknesses of single layers in multilayer films allowing for the first time inline process monitoring and efficient process guiding of flat-film and blow-film extrusion lines.
机译:在与传感器技术部门的工业合作伙伴的联合国家项目中,机械工程和塑料薄膜产量,Fraunhofer激光技术研究所(ILT)开发了一种新颖的光学传感器,以监测基于低温测量的塑料薄膜的生产相干辐射[1]。这种光学相干断层扫描技术(OCT)是一种产生高分辨率断层扫描的成像方法。传感器测量多层膜中单层的厚度,允许第一时间内联的过程监测和有效的平板和吹膜挤出线路引导。

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