首页> 外文会议>10th IMEKO symposium : Laser metrology for precision measurement and inspection in industry (LMPMI) 2011 >Low Coherence Interferometry for the Inline Measurement of Translucent Multilayer Structures
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Low Coherence Interferometry for the Inline Measurement of Translucent Multilayer Structures

机译:低相干干涉法在线测量半透明多层结构

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In a joint national project with industrial partners in the sectors of sensor technology, mechanical engineering and plastic film production, the Fraunhofer Institute for Laser Technology (ILT) has developed a novel optical sensor to monitor the production of plastic films based on interferometric measurements with low coherent radiation [1]. This technique of Optical Coherence Tomography (OCT) is an imaging method generating high-resolution tomography scans. The sensor measures the thicknesses of single layers in multilayer films allowing for the first time inline process monitoring and efficient process guiding of flat-film and blow-film extrusion lines.
机译:弗劳恩霍夫激光技术研究所(ILT)在与传感器技术,机械工程和塑料膜生产领域的工业合作伙伴的国家联合项目中,开发了一种新型光学传感器,可基于干涉测量法以低的监测量来监视塑料膜的生产。相干辐射[1]。光学相干断层扫描(OCT)技术是一种生成高分辨率断层扫描的成像方法。该传感器可测量多层膜中单层的厚度,从而首次实现在线过程监控以及对平膜和吹膜挤出生产线的有效过程引导。

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