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Interferometric Measuring Systems of Nanopositioning and Nanomeasuring Machines

机译:纳米定位和纳米批量机器干涉测量系统

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The Nanopositioning and Nanomeasuring Machine (NMM-1) developed at the Ilmenau University of Technology is equipped with three homodyne plane-mirror miniature interferometers for the measurement of the displacement of a movable corner mirror. The object being measured is placed on the corner mirror, which is positioned by a three-axis drive system. The probing system and the plane-mirror miniature interferometers are fixed on a metrology frame made of Zerodur~(~R). Depending on the selected probing system, the machine is capable of carrying out both 2(1/2)D surface scans and 3D coordinate measurements [1, 2, 3]. In this way objects can be measured or scanned in volumes up to 25 mm X 25 mm X 5 mm with nanometre precision using various optical and tactile probe systems.
机译:在ILMENAU技术大学开发的纳米定位和纳米卷积机(NMM-1)配备了三个仿生平面镜微型干涉器,用于测量可移动角镜的位移。正在测量的物体放置在角镜上,该角镜由三轴驱动系统定位。探测系统和平面镜微型干涉器固定在由Zerodur〜(〜r)制成的计量框架上。根据所选的探测系统,机器能够执行2(1/2)D表面扫描和3D坐标测量[1,2,3]。以这种方式,可以使用各种光学和触觉探针系统以纳米精度测量或扫描最多25mm×25mm×5mm的体积的物体。

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