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Study of edge detection of printed circuit board photoelectric image based on multi-scale wavelet transform

机译:基于多尺度小波变换的印刷电路板光电图像边缘检测研究

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摘要

Aiming at the dark printed circuit board photoelectric image that contains noise acquired by CCD system, the edge detection method by using multi-scale wavelet transform is proposed. Firstly, its basic principle is analyzed in detail, and the simple physics explanation and formula deduction are given. Secondly, the idiographic detection steps are given. Finally, the results of experiment verify the correctness of theory analysis.
机译:针对暗印刷电路板的光电图像,其中包含CCD系统获取的噪声,提出了利用多尺度小波变换的边缘检测方法。首先,详细分析其基本原理,并给出了简单的物理解释和配方扣除。其次,给出了IDIoGraphic检测步骤。最后,实验结果验证了理论分析的正确性。

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