Analysis about Crafts and Technologies of Low-PIM and PIM Interference Testing System

摘要

Main low-PIM crafts were summarized, such as material requirements of major devices and special requirements of electroplating process. The setting up technologies of a PIMI testing system was discussed, for example reducing the number of connectors, isolators being used to prevent active IM and requirements of subsystem and receiver being given. Based on those crafts and technologies, a PIMI testing system was setting up with a design goal of 3rd residual PIM being -165dBc@2x43dBm. It achieved the goal with -165 dBc through actual measuring after calibration.