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Interferometric testing of optical angular scales and structures

机译:光学角度尺度和结构的干涉测量测试

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The application of a Fizeau interferometer for quality check of angular scales, optical limbs, raster etc. fabricated by means of precision laser writer system CLWS-300IAE is discussed. Computer simulation and experimental results are presented. One of the promising fabrication technology of high-precision optical angular scales (OAS) for rotary encoder is direct laser writing with circular scanning, implemented on CLWS-300. Operational control of manufacturing precision is necessary for the successful implementation of this method. Currently, testing OAS with accuracy of 0.1 arcsec can be achieved only in the metrological centers. Obviously, it restrains practical application of this method. In this paper, we propose to use a standard Fizeau interferometer for operational control of OAS quality. An important feature of CLWS-300 is the ability to fabricate OAS and arbitrary diffraction structures in a single process. In this case, the linear diffraction grating (DG) and OAS have the same fabrication errors. Linear DGs wavefront distortion can be interferometrically tested in reflection under Littrow angle (Fig.1a). At the presence of writing errors, distortions of the interference pattern can be observed (Fig. 1b). Analyzing these distortions along a ring with radius R gives the values of wavefront distortion directly lead to the angular error. The angular error ε of the CLWS-300 can be calculate by ΔW~mεR/Tλ, where ΔW is the wavefront error, m is diffraction order, T is the spacing of the DG and λ is wavelength. For the parameters m=5, ε=1 arc. sec., R=20 mm, 7=2 μm we observed distortions ΔW ~ 0.025 λ (Fig.1c).
机译:讨论了通过精密激光作者系统CLWS-300IA制造的角尺度,光学四肢,栅格等的质量检查的应用Fizeau干涉仪。提出了计算机仿真和实验结果。用于旋转编码器的高精度光学角度秤(OAS)的有希望的制造技术之一是具有圆形扫描的直接激光书写,在CLWS-300上实现。制造精度的操作控制是为了成功实现这种方法的必要条件。目前,只能在计量中心在0.1弧度的精度测试OAS。显然,它限制了这种方法的实际应用。在本文中,我们建议使用标准的Fizeau干涉仪进行OAS质量的操作控制。 CLWS-300的一个重要特征是在一个过程中制造OAS和任意衍射结构的能力。在这种情况下,线性衍射光栅(DG)和OA具有相同的制造误差。线性DGS波前变形可以在LitTrow角度下的反射中进行干涉测试(图1A)。在写入错误的存在下,可以观察到干扰图案的扭曲(图1B)。沿着带半径R的环分析这些扭曲给出了波前失真的值直接导致角度误差。 CLWS-300的角度误差ε可以通过ΔW〜mεr/tλ来计算,其中Δw是波前误差,m是衍射顺序,t是dg和λ的间隔是波长的。对于参数m = 5,ε= 1弧。秒,r = 20 mm,7 =2μm,我们观察到畸变Δw〜0.025λ(图1c)。

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