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Suitable characterization methods and insulating materials for devices operating above 200 °C

机译:适用于200°C以上的装置的表征方法和绝缘材料

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Two characterization techniques, the steady-state Conduction Current (CC) and the low frequency Dielectric Spectroscopy (DS) are reviewed and compared to each other in order to choose the most suitable method for evaluating the static electrical conductivity (σ_(DC)) of an insulating material. In the case of polymeric materials operating above 200°C, the DS appears as being better suited. These techniques are applied for insulating materials identified as good candidates for high temperature (HT) applications and new results are presented. HT polyimide, parylene films and silicon nitride substrates are studied. These examples highlight the σ_(DC) magnitudes for temperatures up to 400 °C, as well as other relevant parameters to be taken into account for practical applications.
机译:两种表征技术,稳压传导电流(CC)和低频介电光谱(DS)彼此进行评估,以便选择最合适的方法来评估静态电导率(Σ_(DC))绝缘材料。在高于200℃的聚合物材料的情况下,DS看起来更适合。这些技术用于绝缘材料被识别为高温(HT)应用的良好候选,并提出了新的结果。研究了HT聚酰亚胺,聚对二甲苯膜和氮化硅基材。这些示例突出显示高达400°C的温度的Σ_(DC)幅度,以及用于实际应用的其他相关参数。

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