THEORY OF EDGE RADIATION. PART II: ADVANCED APPLICATIONS AND IMPACT ON XFEL SETUPS

摘要

In this paper we exploit a formalism to describe Edge Radiation, which relies on Fourier Optics techniques, described in another contribution to this conference. First, we apply our method to develop an analytical model to describe Edge Radiation in the presence of a vacuum chamber. Such model is based on the solution of the field equation with a tensor Green's function technique. In particular, explicit calculations for a circular vacuum chamber are reported. Second, we consider the use of Edge Radiation as a tool for electron beam diagnostics. We discuss coherent Edge Radiation, extraction of Edge Radiation by a mirror, and other issues becoming important at high electron energy and long radiation wavelength. Based on this work we also study the impact of Edge Radiation on XFEL setups and we discuss recent results. These proceedings are based on the article [1], to which we address the interested reader for further information and references.