Coverage-Based Test Sequences for FSM/EFSM Models

摘要

Generation of minimum-length test sequences (MLTS) for FSM/EFSM models has been the focus of recent studies. Although it aims to optimize test cycles and expedites product marketing, an MLTS may fail to reveal potential discrepancies between an implementation and its specification. In this paper, MLTS methods combining FSM/EFSM models and pseudo random test generation techniques to enhance test coverage are presented.