A series of Co-Bi thin films with Co concentrations c=0, 0.05, 0.2, 0.26, 0.3, 0.333, 0.375, 0.545, were grown by magnetron sputtering on Si(100)/SiN_χ substrates. Resistivity measurements at zero field (p_(xx)) as a function of temperature-T exhibit an exponential variation with T in the region of 240K展开▼