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Pr_(0.5)Ca_(0.5)MnO_3 thin films deposited on LiNbO_3 substrates

机译:PR_(0.5)CA_(0.5)MNO_3薄膜沉积在LINBO_3基板上

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Thin films of Pr_(0.5)Ca_(0.5)MnO_3 have been deposited on z-cut LiNbO_3 by pulsed laser ablation. The X- ray diffraction measurements showed that the films have grown highly oriented on LiNbO_3, with a pseudocubic (111) preferred growth direction. The thicknesses of the films, measured by low angle X-ray reflectivity, are between 13 and 140 nm. Their electrical resistivity present a semiconducting-like behaviour with an anomaly around 240 K, that corresponds to the charge ordering transition. The temperature of the transition (T_(co)) was estimated from In p vs. (1/T) plots. The charge ordering temperature was found to be dependent on the strain induced by the lattice mismatch on the.films.
机译:通过脉冲激光消融沉积PR_(0.5)CA_(0.5)CA_(0.5)MNO_3的薄膜。 X射线衍射测量表明,薄膜在LinbO_3上高度取向,具有假细胞(111)优选的生长方向。通过低角度X射线反射率测量的膜的厚度在13至140nm之间。它们的电阻率存在于大约240k的异常的半导体样行为,其对应于电荷排序转变。转变的温度(T_(CO))估计在P与(1 / T)图中估计。发现电荷排序温度取决于用晶格错配在薄膜上诱导的菌株。

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