Diagnosis Method Based on Chaos Optimization Algorithm of The Testability of Complex circuit system

摘要

It needs to put structure of boundary scan in the circuit board for improving the controllability and observability of the device in complex circuit board. At the same time when structure of boundary scan improves pcb-level circuit testability, it also increased the complexity of circuit design which needs to weigh the testability improvement and design complexity, two factors. In view of the combinatorial optimization problem of the design complexity and minimize, solving method based on chaos optimization algorithm is proposed. Through example validation, the algorithm were obtained good results on optimization effect and operation time. The fact proved that, the algorithm can be effectively applied in board-level circuit testability design optimization and improving pcb-level circuit testability.