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Characterization of micro-scale surface features using PartialDifferential Equations

机译:使用部分微分方程的微观表面特征的表征

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Mass production of components with micro and nano scale surface features is known as micromoulding and is very sensitive to a number of variables that can cause important changes in the surface geometry of the components. The surface itself is regarded as a key element in determining the product's functionality and as such must be subject to thorough quality control procedures. To that end, a number of surface measurement techniques have been employed namely, White Light Interferometry (WLI) and Atomic Force Microscopy (AMF), whose resulting data is given in the form of large and rather unmanageable Cartesian point clouds. This work uses Partial Differential Equations (PDEs) as means for characterizing efficiently the surfaces associated with these data sets. This is carried out by solving the Biharmonic equation subject to a set of boundary conditions describing outer surface contours extracted from the raw measurement data. Design parameters are expressed as a function of the coefficients associated with the analytic solution of the Biharmonic equation and are then compared against the design parameters describing an ideal surface profile. Thus, the technique proposed here offers means for quality assessment using compressed data sets.
机译:具有微型和纳米刻度表面特征的组件的大规模生产被称为微塑料,对许多变量非常敏感,这可能导致组件的表面几何形状的重要变化。表面本身被视为确定产品功能的关键元素,因此必须受到彻底的质量控制程序。为此,已经采用了许多表面测量技术,即白色光干涉测量(WLI)和原子力显微镜(AMF),其所得数据以大且不管理的笛卡尔点云的形式给出。该工作使用部分差分方程(PDE)作为用于有效地表征与这些数据集相关联的表面的装置。这是通过求解经受描述从原始测量数据提取的外表面轮廓的一组边界条件来执行的。设计参数表示为与双音态方程的分析解相关的系数的函数,然后与描述理想表面剖面的设计参数进行比较。因此,这里提出的技术提供了使用压缩数据集提供质量评估的装置。

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