One shot projected fringe profilometry using a 2D fringe-encoded pattern

摘要

A one-shot technique for profile measurements is presented. A two-dimensional deinge-encoded pattern is used to illuminate the inspected object and a monochromatic camera is employed to observe the deformed fringes at another view angle. The 2D fringe-encoded pattern provides additional information to identify the fringe order. Even though the surface color or reflectivity varies rapidly with positions, it distinguishes the fringe order very well.