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Determination of the Dielectric Constant and the Thicknessof Gold Film by SPR Technique

机译:SPR技术测定介电常数和金膜厚度

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Experimental data obtained from the SPR technique was fitted using the Winspall simulation program to determine the dielectric constant and the thickness of its gold film. Experiment was performed by measuring the reflectance of reflected light against the incoming angle of Kretschmann configuration. Two kind of prisms were used namely BK7 and SF11. For a comparison, the same data was processed with manual calculation based on Fresnel and Kretschmann formulation. The difference between result from Winspall simulation program and that from manual calculation was 2.86% for BK7/Au/Air and 15.78% for SF11/Au/Air.
机译:使用WinSPALL仿真程序拟合从SPR技术获得的实验数据,以确定其金膜的介电常数和厚度。通过测量反射光的反射率来进行实验,以抵抗克莱茨曼配置的输入角度。使用两种棱镜即为BK7和SF11。为了进行比较,通过基于菲涅耳和Kretschmann制剂进行手动计算处理相同的数据。来自WinSpall仿真程序的结果与手动计算之间的差异为BK7 / AU / AIR的2.86%,SF11 / AU / AIR的15.78%。

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