Improvements to Spectral Spot-Scanning Technique for Accurate and Efficient Data Acquisition

摘要

An improved and optimized spectral spot-scanning system for visible focal plane array (FPA) sub-micron pixel photo-response testing is presented. This updated configuration includes: (1) additional diagnostic analysis tools which more completely characterize the operation of the system; (2) a confocal microscope fitted into the optical system to aid in more precise determination of spot focusing on the imager; (3) a post-acquisition transformation to imager pixel response data to reduce overall data acquisition time. Wavelength-dependent pixel response data is presented to demonstrate the repeatability of this setup as well as to quantify the impact of random and systematic experimental errors.