Reliability assessment of GaAs- and InP-based diode lasers for high-energy single-pulse operation

摘要

With the maturing of high-power diode laser technology, studies of laser-assisted ignition of a variety of substances are becoming an increasingly popular research topic. Its range of applications is wide – from fusing in the defense, construction and exploration industries to ignition in future combustion engines. Recent advances in InP-based technology have expanded the wavelength range that can be covered by multi-watt GaAs- and InP-based diode lasers to about 0.8 to 2 p.m. With such a wide range, the wattage is no longer the sole defining factor for efficient ignition. Ignition-related studies should include the interaction of radiation of various wavelengths with matter and the reliability of devices based on different material systems. In this paper, we focus on the reliability of pulsed laser diodes for use in ignition applications. We discuss the existing data on the catastrophic optical damage (COD) of the mirrors of the GaAsbased laser diodes and come up with a non-destructive test method to predict the COD level of a particular device. This allows pre-characterization of the devices intended for fusing to eliminate failures during single-pulse operation in the field. We also tested InP-based devices and demonstrated that the maximum power is not limited by COD. Currently, devices with >10W output power are available from both GaAs- and InP-based devices, which dramatically expands the potential use of laser diodes in ignition systems.