Reliability study on 50-100-mW CW operation of 680-nm visible laser diodes with a window-mirror structure

摘要

We have studied reliability of 680-nm visible laser diodes (LDs) with a window-mirror structure formed by zinc-diffusion-induced disordering of GaInP quantum wells. Aging tests under the condition of CW output power in the range of 50-100 mW for ambient temperature from 40/spl deg/C to 70/spl deg/C have been carried out for 650-/spl mu/m-long LDs and 900-/spl mu/m-long LDs with three kinds of the front facet reflectivities (1.5%, 6% and 13%). In all tests, laser operation was stable for over 5000 h. For example, reliable 500-10000-h operation of the 900-/spl mu/m LDs was realized under the conditions of output power of 50 mW at 70/spl deg/C, 70 mW at 60/spl deg/C, and 100 mW at 40/spl deg/C for the first time. By various aging test results, dependence of the temperature and the output power on increase of the operating current has been investigated. Also, influences of the facet reflectivities and the cavity lengths on the reliability have been studied with focus on the optical power density and the current density. Consequently, it has been clarified that the degradation of the window LDs rather strongly depends on the operating current density than the optical power density. Moreover, it has been proven that the reliability of the window LDs is effectively improved by the reduction of the operating current density due to extension of the cavity length.