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Residual Stresses in a SOFC

机译:SOFC中的残余应力

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Solid Oxide Fuel Cell (SOFC) is a high-performance electrochemical device for energy conversion. A single cell is composed of 5 layers of different materials: anode support, anode functional layer, electrolyte, cathode functional layer and cathode. The mechanical integrity of the cell is a major issue during its life time, particularly for the electrolyte layer. Cell damage is mainly caused by the geometry of the system, the high operating temperature and the brittleness of the materials. Residual stresses are known to play a significant role in damage evolution, it is therefore important to determine them. For this purpose, residual stresses in an anode-supported planar SOFC were measured by X-ray diffraction using the Sin2Ψ method. Firstly, global stresses in each phase of each layer were measured using an X-ray goniometer at room temperature. This technique is based on measurements of the crystal lattice deformation. Secondly, local strain measurements were carried out on the grains of electrolyte layer by both X-ray synchrotron radiation and a new technique derived from EBSD pattern analysis. White beam micro-diffraction enables high accuracy measurement on a micrometer scale and can be used to determine the variation of deformation from grain to grain in the electrolyte. The spatial resolution of the EBSD based elastic strain measurement is much better, in the range of 20nm for ceramics materials. Stress variation within the grain can then be analysed. These two complementary techniques at different scales coupled with a fine characterization of the microstructure will contribute to a better understanding of the residual stresses in the electrolyte layer and thus to the damage mechanisms.
机译:固体氧化物燃料电池(SOFC)是用于能量转换的高性能电化学装置。单个电池由5层不同的材料组成:阳极载体,阳极功能层,电解质,阴极功能层和阴极。细胞的机械完整性是其寿命期间的主要问题,特别是对于电解质层。电池损坏主要由系统的几何形状,高工作温度和材料的脆性引起。已知残余应力在损伤进化中发挥重要作用,因此确定它们是重要的。为此目的,通过使用SIN21法通过X射线衍射测量阳极支持的平面SOFC中的残余应力。首先,在室温下使用X射线测振仪测量每层的每个阶段的全局应力。该技术基于晶格变形的测量。其次,通过X射线同步辐射辐射和衍生自EBSD图案分析的新技术对电解质层的晶体进行局部应变测量。白光束微衍射使得能够在微米刻度上测量高精度测量,并且可用于确定从电解质中的谷物变形的变形变形。基于EBSD的弹性应变测量的空间分辨率更好,在20nm的陶瓷材料的范围内。然后可以分析谷物内的应力变化。在与微观结构的细小表征的不同刻度下的这两个互补技术将有助于更好地理解电解质层中的残余应力,从而有助于损坏机构。

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