首页> 外文会议>International Conference on Manufacturing Science and Engineering >Dynamic Analysis of Optical Brittle Crystal Slicing by Using Wiresaw
【24h】

Dynamic Analysis of Optical Brittle Crystal Slicing by Using Wiresaw

机译:用线锯的光脆晶体切片动态分析

获取原文

摘要

In recent years, wire sawing is considered to be a potentially better technology of slicing brittle crystals especially semiconductor, owing to the unmatched advantages of slicing large ingot into thin wafers with high efficiency, fine quality and less kerf loss. This paper analyses the dynamic effect on wire from a variety of excitation and mechanical structure in the process of cutting on the basis of the effects of vibration on slicing wafer quality. A suitable model is built according to Hamilton principle, closed form expressions is present for the steady state response using finite element method. The relation between inherent characteristics of wiresaw and different system parameters is obtained.
机译:近年来,由于将大锭切成薄晶片的薄晶片,具有高效率,精细质量,较低的晶圆,尤其是切片脆性晶体尤其是切割脆性晶体的可能更好的技术。本文在切割过程中,分析了各种激励和机械结构的动态效应。基于振动对切片晶片质量的影响。根据汉密尔顿原理建立了合适的模型,使用有限元方法存在闭合状态响应的闭合形式。获得了线锯和不同系统参数的固有特性之间的关系。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号