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Effects of Preparing Conditions on NO_(2-)sensing Properties of Sputtered WO_3 Nano-films

机译:溅射WO_3纳米膜NO_(2-)感测性能的制备条件的影响

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WO_3 nano-films were deposited on A1_2O_3 substrate by dc reactive magnetron sputtering method. The effects of preparing conditions, such as the discharge gas ratio (Ar:O_2), working pressure, sputtering time and annealing temperature on microstructure, crystalline state and NO_2-sensing properties of WO_3 nano-films were investigated by orthogonal trial experiment method. The optimum technological conditions were determined by orthogonal test and extreme difference analysis. The crystallization, morphology and composition of WO_3 thin film obtained at the optimal parameters were studied by XRD, SEM and XPS. The gas sensing mechanism was also studied. WO_3 nano-film shows high sensitivity, fast response, good selectivity at the best operating temperature 200°C.
机译:通过DC反应磁控溅射法在A1_2O_3基板上沉积WO_3纳米膜。通过正交试验方法研究了制备条件的制备条件,例如放电气体比(Ar:O_2),工作压力,溅射时间和退火温度对微结构的微观结构,结晶状态和NO_2感测性能。通过正交试验和极差分分析确定了最佳的技术条件。通过XRD,SEM和XPS研究了在最佳参数下获得的WO_3薄膜的结晶,形态和组成。还研究了气体传感机制。 WO_3纳米膜显示出高灵敏度,快速响应,在最佳工作温度200°C时选择性良好。

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