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Low-FOM planar MOSFET

机译:低FOM平面MOSFET

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摘要

Low FOM (Figure-of-merit) planar MOSFET is presented in this paper. The p-base of the developed MOSFET is formed by self-aligned ion implanted. Only four masks is used to fabrication while the performance of the developed MOSFET is better than the present conventional MOSFET. The optimized 20V rated MOSFET exhibits about 7.8mΩ·mm~2 specific on-resistance, 1.2nC·mm~2 and 3.4 nC·mm~2 gate-drain charge and gate charge respectively. There is a reduction of 57% in the Figure of Merit.
机译:本文提出了低FOM(图型)平面MOSFET。开发MOSFET的P底座由植入的自对准离子形成。在开发MOSFET的性能优于当前MOSFET的情况下,仅使用四个面罩制造。优化的20V额定MOSFET分别显示出约7.8mΩ·mm〜2的电阻,1.2nc·mm〜2和3.4 nc·mm〜2栅极 - 漏极电荷和栅极电荷。在优点中减少了57%。

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