Behavior of Surface Flashover Depending on Gap Distance of End Shield in Vacuum Interrupter

摘要

In this paper, 3 types of models were used to analyze maximum E field of each model and the influence of shape of shield could be identified. As a result, proposed L type shield could reduce the maximum E field by 20%. Secondly, the influence of the gap distance between end shields on E field was analyzed. As the gap distance become short the gap distance between inner walls of ceramic also become short. And the maximum E field concentrated on inner wall of ceramic finally increased. It is thought that the deterioration of dielectric strength in VI can be acquired if the creepage distance is sufficient. Thirdly, the experiment was conducted by fabricating each prototype. As a result, no creepage occurred in shieldless model. In other words, creepage occurred in the shield-installed models. And creepage inception voltages were different from each other because of the difference of maximum E field. Fourthly, The equation that shows relation between calculated E field and measured creepage inception voltage was proposed as a result of FEM analysis and experiment.