Development of quantitative electric force microscopy for surface and subsurface characterization of nanostructures in polymeric coatings

摘要

Electric Force Microscopy (EFM), a variant of Atomic Force Microscopy (AFM), is a promising technique for both surface and subsurface characterization of nanostructures in polymeric coatings. However, the broad application of EFM technique in polymeric materials is limited by its current qualitative status. In this study, quantitative EFM characterization on nanostructured polymer films and carbon nanotubes dispersed in nanocomposite coatings is pursued by the use of custom-made high-aspect- ratio AFM probes under controlled humidity conditions and development of the analytical models. Advantages of quantitative EFM imaging relative to the widely used AFM phase imaging techniques are highlighted. The quantitative EFM technique will potentially be a valuable tool for a broad range of applications in the coatings industry.